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Issue 11 of Highlights in Chemical Technology now available
23 October 2009
Drawing together the best content from all RSC publications to highlight the latest applications and technological aspects of research

Sector Field Instrumentation themed issue
15 September 2009
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06 August 2009
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Contents list for Journal of Analytical Atomic Spectrometry, issue 12, 2009
Front cover
J. Anal. At. Spectrom., 2009, 24, 1589
DOI: 10.1039/B923130G

Inside front cover
J. Anal. At. Spectrom., 2009, 24, 1590
DOI: 10.1039/B923131P
Contents and Highlights in Chemical Technology
J. Anal. At. Spectrom., 2009, 24, 1591
DOI: 10.1039/B923132N
Atomic Spectrometry Update
Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials
Simon Carter, Andy S. Fisher, Phill S. Goodall, Michael W. Hinds, Steve Lancaster and Sian Shore,
J. Anal. At. Spectrom., 2009, 24, 1599
DOI: 10.1039/b920784h

This update reviews the recent advances in industrial analysis.
Papers
Identification of selenium compounds using HPLC-ICPMS and nano-ESI-MS in selenium-enriched rice via foliar application
Yong Fang, Yaofang Zhang, Brittany Catron, Qilin Chan, Qiuhui Hu and Joseph A. Caruso,
J. Anal. At. Spectrom., 2009, 24, 1657
DOI: 10.1039/b912538h

Se-enriched rice is widely produced by foliar application in the Se-deficiency area of China.
Laser ablation—laser induced breakdown spectroscopy (LA-LIBS): A means for overcoming matrix effects leading to improved analyte response
Bret C. Windom and David W. Hahn,
J. Anal. At. Spectrom., 2009, 24, 1665
DOI: 10.1039/b913495f

Laser-ablation laser-induced breakdown spectroscopy (LA-LIBS) is proposed as a novel analytical scheme with goals of improved analyte response, minimization of sample matrix effects, and use of non-matrix matched standards.
Technical Notes
Quantification of matrix effects in the determination of lead content in soldering tin by ICP-IDMS
Liuxing Feng, Jun Wang, Jingbo Chao and Hai Lu,
J. Anal. At. Spectrom., 2009, 24, 1676
DOI: 10.1039/b908057k

Using the standard addition method, the matrix effects on Pb isotopes in soldering matrix solution can be clearly observed. Moreover, the matrix effect coefficient can be calculated from the standard addition method and applied to correct the matrix effect in ICP-IDMS. In this way, the matrix effects can be corrected during the ICP-IDMS process.
Thickness monitoring of sub-nanometer scale La2O3 films using total X-ray reflection fluorescence spectrometry
J. S. Lee and H. B. Lim,
J. Anal. At. Spectrom., 2009, 24, 1681
DOI: 10.1039/b908021j

This study introduces an advanced method to measure sub-nanometer scale La2O3 films using total X-ray reflection fluorescence spectrometry (TXRF). TXRF can be applied as a monitoring tool for the thickness distribution of the La2O3 deposition process when the density is controlled constantly.
Back matter
J. Anal. At. Spectrom., 2009, 24, 1684
DOI: 10.1039/B923133C
Back cover
J. Anal. At. Spectrom., 2009, 24, 1687
DOI: 10.1039/B923134J




