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Innovative research on the fundamental theory and application of spectrometric techniques.
Contents list for Journal of Analytical Atomic Spectrometry, issue 12, 2009
Front cover
J. Anal. At. Spectrom., 2009, 24, 1589
DOI: 10.1039/B923130G
Inside front cover
J. Anal. At. Spectrom., 2009, 24, 1590
DOI: 10.1039/B923131P
Contents and Highlights in Chemical Technology
J. Anal. At. Spectrom., 2009, 24, 1591
DOI: 10.1039/B923132N
Atomic Spectrometry Update
Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials
Simon Carter, Andy S. Fisher, Phill S. Goodall, Michael W. Hinds, Steve Lancaster and Sian Shore,
J. Anal. At. Spectrom., 2009, 24, 1599
DOI: 10.1039/b920784h
Papers
Identification of selenium compounds using HPLC-ICPMS and nano-ESI-MS in selenium-enriched rice via foliar application
Yong Fang, Yaofang Zhang, Brittany Catron, Qilin Chan, Qiuhui Hu and Joseph A. Caruso,
J. Anal. At. Spectrom., 2009, 24, 1657
DOI: 10.1039/b912538h
Laser ablation—laser induced breakdown spectroscopy (LA-LIBS): A means for overcoming matrix effects leading to improved analyte response
Bret C. Windom and David W. Hahn,
J. Anal. At. Spectrom., 2009, 24, 1665
DOI: 10.1039/b913495f
Technical Notes
Quantification of matrix effects in the determination of lead content in soldering tin by ICP-IDMS
Liuxing Feng, Jun Wang, Jingbo Chao and Hai Lu,
J. Anal. At. Spectrom., 2009, 24, 1676
DOI: 10.1039/b908057k
Thickness monitoring of sub-nanometer scale La2O3 films using total X-ray reflection fluorescence spectrometry
J. S. Lee and H. B. Lim,
J. Anal. At. Spectrom., 2009, 24, 1681
DOI: 10.1039/b908021j
Back matter
J. Anal. At. Spectrom., 2009, 24, 1684
DOI: 10.1039/B923133C
Back cover
J. Anal. At. Spectrom., 2009, 24, 1687
DOI: 10.1039/B923134J
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