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Caption : fig. s1. x-ray diffraction pattern (<i>θ</i>-2<i>θ</i> scans) of as-grown smnio<sub>3</sub>/srtio<sub>3</sub>(001) thin film from 20°-80° under 15mpa annealing oxygen pressure. (data from the reference <sup>1</sup>)

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Caption : fig. s2. reciprocal space mappings of as-grown (a) smnio<sub>3</sub>/srtio<sub>3</sub>(001) (data from the reference <sup>1</sup>), (b) smnio<sub>3</sub>/laalo<sub>3</sub>(001) (data from the reference <sup>1</sup>), (c) ndnio<sub>3</sub>/laalo<sub>3</sub>(001) and (d) eunio<sub>3</sub>/laalo<sub>3</sub>(001) under 15mpa annealing oxygen pressures.

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Caption : fig. s3. x-ray diffraction patterns (<i>θ</i>-2<i>θ</i> scans) of as-grown (a) smnio<sub>3</sub>/laalo<sub>3</sub>(001) (b) ndnio<sub>3</sub>/laalo<sub>3</sub>(001) (c) eunio<sub>3</sub>/laalo<sub>3</sub>(001) and (d) gdnio<sub>3</sub>/laalo<sub>3</sub>(001) thin films from 20°-80° under various annealing oxygen pressures.

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Caption : fig. s4. the transmission electron microscopy (tem) images of the interfacial regions of (a) sno/lao and (b) sno/sto

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Caption : fig. s5. the interfacial charge transfer of (a) laalo<sub>3</sub>-ndnio<sub>3</sub> interface (b) srtio<sub>3</sub>-ndnio<sub>3</sub> interface (c) laalo<sub>3</sub>-eunio<sub>3</sub> interface (d) srtio<sub>3</sub>-eunio<sub>3</sub> interface (e) laalo<sub>3</sub>-gdnio<sub>3</sub> interface (f) srtio<sub>3</sub>-gdnio<sub>3</sub> interface.

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Caption : fig. s6. plots of ln (<i>ρ</i><sub>t</sub>)-<i>t</i><sup>-0.25</sup> for (a) smnio<sub>3</sub> 0.1 mpa (b) smnio<sub>3</sub> 4 mpa (c) smnio<sub>3</sub> 15 mpa (d) eunio<sub>3</sub> 0.1 mpa (e) eunio<sub>3</sub> 4 mpa (f) eunio<sub>3</sub> 8 mpa (g) eunio<sub>3</sub> 15 mpa (h) gdnio<sub>3 </sub>0.1 mpa (i) gdnio<sub>3</sub> 4 mpa (j) gdnio<sub>3</sub> 8 mpa (k) gdnio<sub>3</sub> 15 mpa (data from reference <sup>6</sup>) grown on laalo<sub>3</sub>(001) substrates. black lines are the linear fitting curves.

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Caption : fig. s7. plots of ln (<i>ρ</i><sub>t</sub>)-<i>t</i><sup>-1/3</sup> for (a) smnio<sub>3</sub> 0.1 mpa (b) smnio<sub>3</sub> 4 mpa (c) smnio<sub>3</sub> 15 mpa (d) eunio<sub>3</sub> 0.1 mpa (e) eunio<sub>3</sub> 4 mpa (f)eunio<sub>3</sub> 8 mpa (g) eunio<sub>3</sub> 15 mpa (h) gdnio<sub>3</sub> 0.1 mpa (i) gdnio<sub>3</sub> 4 mpa (j) gdnio<sub>3</sub> 8 mpa (k) gdnio<sub>3</sub> 15 mpa (data from reference <sub>6</sub>) grown on laalo<sub>3</sub>(001) substrates. black lines are the linear fitting curves.

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Caption : fig. s8. (a) x-ray diffraction pattern (<i>θ</i>-2<i>θ</i> scans) and (b) reciprocal space mapping of as-grown nd<sub>0.3</sub>sm<sub>0.4</sub>gd<sub>0.3</sub>nio<sub>3</sub>/laalo<sub>3</sub> (001)