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Caption : figure s1. x-ray photoelectron spectroscopy (xps) survey scans from (a) purified and (b) functionalized samples. carbon 1s peak is at 284.6 ev.

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Caption : figure s2. tem micrographs from the as-prepared and purified samples. (a) metal (fe) and carbonaceous contaminants in the as-prepared swcnts are seen as dark spots and black patches in the image. swcnt networks of (b) large scale and (c) high resolution tem micrographs after the purification process. drastic reduction of the impurity particles is visible in the post-purified sample (b, c).