AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark. Learn about the latest developments in SPM (Scanning Probe Microscopy), with talks from leading scientists including Professor Mingdong Dong of Aarhus University and Kai Dirscherl of DFM. Bring your own samples to test on the world’s fastest AFM.
AFM Workshop
The workshop will be held at DFM in Lyngby, near Copenhagen in Denmark. The day run from 9:30am – 5:00pm, covering the latest SPM techniques:- Fastscanning – How to scan samples of any size at the fastest speeds.
- PeakForce Tapping – Unprecedented high resolution and simultaneous nanoscale property mapping. Image a new range of samples, previously thought impossible with AFM.
- Nanochemical identification – Using AFM-RAMAN.
Practical Sessions – Bring your own samples
Take the opportunity to try out the techniques discussed, with hands-on, practical sessions. Bring your own samples to test on the Bruker Dimension FastScan AFM. The Dimension FastScan is the world’s fastest AFM, suitable for a wide range of sample types, from soft biological samples to very hard materials. Try it out for yourself, using your own real-world samples, and see the results first-hand!Presentations
Hear talks from scanning probe microscopy experts and users, including:- Associate Prof. Mingdong Dong of Aarhus University will give a presentation about how the Bio-SPM group are using SPM to investigate the physical and chemical properties of biomolecules and new materials based on nano objects. The group has also developed SPM techniques to study the mechanical properties of molecules and nano structure self-assembly.
- Dr Kai Dirscherl from the Danish National Metrology Institute (DFM) will give a talk about how he is using PeakForce KPFM mode to identify surface-embedded particles. PeakForce KPFM uses PeakForce Tapping, scan algorithms and unique probes for the highest spatial resolution and most accurate measurements of surface potential.
- Dr Samuel Lesko of Bruker Nano will present the latest SPM developments from Bruker.
- An applications specialist from Renishaw will discuss AFM-Raman, and how SPM can be combined with Raman Spectroscopy to investigate the composition, structure and properties of materials at nanometre scales.
