Recent developments have opened up a whole new range of applications and possibilities for micro-XRF element mapping.
You can now analyse:
The workshop will explain these technological developments and the new possibilities. This will be followed by live demonstrations on the Bruker M4 TORNADO – bring your own samples to analyse, see the results and have your questions answered.
All are welcome; register online using the book now button.
You can now analyse:
- Light elements down to carbon
- Samples with topography
- Vacuum-sensitive materials with a He-purge system
- Higher throughput than ever before
The workshop will explain these technological developments and the new possibilities. This will be followed by live demonstrations on the Bruker M4 TORNADO – bring your own samples to analyse, see the results and have your questions answered.
Programme
- New Applications with Enhanced Micro-XRF – A non-destructive method for elemental mapping from C to Am, Andreas Wittkopp, Bruker
- Invited Speakers TBC
- Hands-on Practical Session, Faulk Reinhardt, Bruker
- Lunch
- Practical Session – Analysing your samples
Registration
There is no charge to attend but advance registration is required. Lunch and refreshments will be provided.All are welcome; register online using the book now button.
