Introduction

The advanced course covers a wide range of topics including systematic errors, factors affecting intensities of diffraction peaks; data reduction algorithms; phase identification; advanced data mining with the PDF and its application in search/match; powder pattern indexing methods; structure solution methods; quantitative phase analysis using both reference intensity ration (RIR) and Rietveld Method.

Deadlines

• Apr 20 2020
  Early bird registration deadline

  
• May 25 2020
  Standard registration deadline

  

Useful links

• Further event details More information about the event

Speakers

• Tom Blanton United States

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Sponsorship & supporting organisations

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Sponsors

ICDD

Venue

International Centre for Diffraction Data

International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, PA, 19073, United States

Useful links

• Venue information More information about the venue

Organised by

ICDD

Contact information

Eileen Jennings
ICDD
ICDD
12 Campus Blvd.
Newtown Square PA 19073
USA
6103259814
Contact us by email

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